Variables that affect Surface Charging, and Methods to Compensate Charging
- Argon ions and electron gun
- Beam position effect
- Beam size effect
- Charge induced peak broadening
- Charge compensation
- Contamination on sample
- Contamination on sample mount
- Contamination of ball bearing in stage
- Curved nature of sample
- Dielectric nature of the surface
- Differential charging: horizontal
- Differential charging: vertical
- Dual beam charge compensation system (electrons with Argon ions)
- Edge effect
- Electron flood gun alignment
- Electron gun operation
- Electron induced degradation
- Geometry of flood gun
- Incident angle of X-ray beam (grazing)
- Magnetic lens repeller system
- Metal masks
- Metal mesh screens
- Oxidation on ball bearing in stage or mount
- Positioning effect
- Sample effects
- Sample grounding
- Sample shape effect
- Sample size effect
- Sample roughness
- Stage grounding
- Structure of surface
- Surface smoothness effect
- Vacuum effects (gases)