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    • Artyushkova, et al
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  • Problems in XPS
    • Appendix of Unreliable BEs – Briggs & Seah
    • Appendix of Unreliable BEs – PHI Handbook
    • Bad Peak-fitting
    • BEs in Journals – Unreliable
    • Book of Unreliable XPS BEs
    • Charging versus BE & FWHM
    • Charge Referencing Problems
    • Charge Referencing vs C Thickness
    • Chemical State Assignments
    • Energy Scale Adjustments – “Engineer”
    • Energy Scale Calibration Values – ISO
    • Energy Scale Measurements – Monthly
    • ISO, VAMAS, ASTM – Limited Help
    • Problems in NIST XPS Database
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    • σ, SFs, RSFs, IMFPs & Atom %s
    • Unreliable BEs in NIST
    • Professors & Editors cause Problems
  • Projects
    • Round Robins
    • Project #1 – The XPS Library
    • Project #3 – Charging & Compensation
    • Project #4 – Charge Referencing
    • Project #5 – SFs, RSFs, IMFPs, Atom%s
    • Project #6 – Bad Peak-fitting
    • Project #7 – Histograms of NIST BEs
    • Project #8 – Laser-XPS
  • XRI Guidelines
    • Atom% Quantification
    • Charge Compensation
      • Charge Neutralization
    • Charge Referencing
    • Chemical State BE Shifts
    • Energy Scale Check & Calibration
    • Experiment Details
    • Flood Gun Operation
    • IMFP: TPP-2M or KE^(-6)
    • Modified Scofield Values
    • Multiplet Splitting
    • Pass Energy Effect
    • Peak-fitting FWHM
    • Peak End Points
    • Sample Preparation
    • SF, RSF, Atom%, Quantification
  • XPS Training
    • Atom% Exam
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    • Charging – Menu Top
    • Charge Control
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    • Precision
    • Reliability
    • Repeatability
    • Reproducibility
    • Uncertainty
    • Unreliable
    • Validity
XPS UsersVince Crist2025-07-22T22:06:24-07:00

XPS Users


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