Variables that affect Surface Charging, and Methods to Compensate Charging

Argon ions and electron gun
Beam position effect
Beam size effect
Charge induced peak broadening
Charge compensation
Contamination on sample
Contamination on sample mount
Contamination of ball bearing in stage
Curved nature of sample
Dielectric nature of the surface
Differential charging: horizontal
Differential charging: vertical
Dual beam charge compensation system (electrons with Argon ions)
Edge effect
Electron flood gun alignment
Electron gun operation
Electron induced degradation
Geometry of flood gun
Incident angle of X-ray beam (grazing)
Magnetic lens repeller system
Metal masks
Metal mesh screens
Oxidation on ball bearing in stage or mount
Positioning effect
Sample effects
Sample grounding
Sample shape effect
Sample size effect
Sample roughness
Stage grounding
Structure of surface
Surface smoothness effect
Vacuum effects (gases)