Skip to content
XPS Research Institute Inc (501c3, DNP) Logo XPS Research Institute Inc (501c3, DNP) Logo
  • XPS Skill Level Certificates
    • XPS Novice (L1) – Silver Certificate – XRI
    • XPS Master (L5) – Positron XRI Certificate
    • Use “Library 4 XPS” to Train Yourself
    • XPS Instrument Operation – Level 1 – Beginner
    • XPS Instrument Operation – Level 2 – Competent
    • XPS Instrument Operation – Level 3 – Master
  • XPS Exams
    • Atom% Exam
    • Charge Compensation Exam
    • Charge Referencing Exam
    • Energy Scale Exam
  • XPS Lessons
    • Lesson 1 – XPS COURSE #500 – Basics of XPS
    • Lesson 3 – XPS COURSE #503 – Terminology
    • Lesson 8 – XPS COURSE #508 – Limits of XPS
    • Lesson 9 – XPS COURSE #509 – Binding Energy Scale Calibration
    • Lesson 10 – XPS COURSE #510 – Electron Configuration & XPS Peak Notation Terms
    • Lesson 18 – XPS COURSE #518 – Accuracy of XPS Binding Energies
  • About Us
    • Contact Us
    • Company Logos
    • Mission Statement
    • Steering Committee
  • Cart – Shop
  • Charge Compensation
    • Artyushkova, Baer, Cohen, Easton, Engelhard, Gengenbach, Greczynski, Mack, Roberts
    • Barr
    • Cazaux
    • Cros
    • Davis, Anderson & Clearfield
    • Engelhard, Baer, Kim, Gaspar
    • Huchital & McKeon
    • Landis & Martin
    • Larson & Kelly
    • Lewis & Kelly
    • Paquette, Caruso , Brockman, Bielefeld, Kuhn, King
    • Sambe & Ramaker
  • Charging
    • Absolute Charge Referencing™
    • Charging
    • Charge Compensation
    • Charge Control
    • Charge Control Methods
    • Charge Correction
    • Charge Neutralization
    • Charge Referencing
    • Charge Referencing Problems
  • Core Activities
    • Accuracy
    • BEs in Journals
    • Chemical State Assignments
    • Energy Scale Check & Calibration
    • Methods
    • Metrology
    • Protocols
    • Reliability
    • Repeatability
    • Software
  • Instrument Operation
    • Charging
    • Charge Compensation
    • Charge Control
    • Charge Correction
    • Charge Neutralization
    • Energy Scale Adjustments – “Engineer”
    • Energy Scale Calibration Values – ISO
    • Energy Scale Check & Calibration
    • Energy Scale Measurements – Monthly
    • Flood Gun Operation
    • Pass Energy Effect
    • Sample Handling Guide
    • Software
  • Peak-fitting
    • Bad Peak-fitting
    • Peak End Points
    • Peak Area End-Points
    • Peak-fit Training Test
    • Peak-fitting FWHM
  • Problems in XPS
    • σ, SFs, RSFs, IMFPs & Atom %s
    • Accuracy
    • Atom% Quantification
    • Bad Peak-fitting
    • BEs in Journals
    • Charge Control
    • Charge Correction
    • Charge Referencing
    • Charging
    • Chemical State Assignments
    • Chemical State BE Shifts
    • Energy Scale Calibration Values – ISO
    • Energy Scale Check & Calibration
    • Experiment Details
    • Flood Gun Operation
    • Instrument Operation
    • ISO, VAMAS, ASTM
    • Modified Scofield Values
    • Multiplet Splitting
    • Pass Energy Effect
    • Peak Area End-Points
    • Peak-fitting FWHM
    • Precision
    • Professors Cause Problem
    • Protocols
    • Reliability
    • Repeatability
    • Reproducibility
    • Sample Preparation
    • Services – Camera Photo
    • Software
    • Uncertainty
    • Unreliable BEs
    • Validity
  • Projects
    • σ, SFs, RSFs, IMFPs & Atom %s
    • Atom% Quantification
    • Bad Peak-fitting
    • Charge Compensation
    • Charge Control
    • Charge Referencing
    • Charging
    • Chemical State Assignments
    • Chemical State BE Shifts
    • Energy Scale Check & Calibration
    • Experiment Details
    • Flood Gun Operation
    • Information from XPS Analyses
    • Instrument Operation
    • Insulator-HOPG-Screen
    • Metrology
    • Modified Scofield Values
    • Peak-fit Training Test
    • Peak-fitting FWHM
    • Reliability
    • Repeatability
    • Round Robins
    • Software
    • Sample Handling Guide
    • Sample Preparation
    • Uncertainty
    • Validity
    • XRI Guidelines
  • Round Robins
    • Accuracy
    • Atom% Quantification
    • Bad Peak-fitting
    • Charge Compensation
    • Charge Control
    • Charge Correction
    • Charge Neutralization
    • Charge Referencing
    • Charging
    • Chemical State Assignments
    • Chemical State BE Shifts
    • Energy Scale Check & Calibration
    • Experiment Details
    • Flood Gun Operation
    • Hands-on XPS Operation Test
    • Instrument Operation
    • Methods
    • Metrology
    • Modified Scofield Values
    • Multiplet Splitting
    • Pass Energy Effect
    • Peak Area End-Points
    • Peak End Points
    • Peak-fitting FWHM
    • Precision
    • Reliability
    • Repeatability
    • Reproducibility
    • Sample Preparation
    • Software
    • Uncertainty
    • Unreliable
    • Unreliable BEs
    • Unreliable BEs in NIST
    • Validity
  • Services
    • Charge Control
    • Charge Neutralization
    • Charging
    • Energy Scale Adjustments – “Engineer”
    • Energy Scale Check & Calibration
    • Flood Gun Operation
    • Hands-on XPS Operation Test
    • Instrument Operation
    • Metrology
    • Protocols
    • Sample Handling Guide
    • Sample Preparation
    • Services – Camera Photo
    • Software
    • XPS School
  • Account
    • Password Reset
  • Members
  • User Profile
    • Members
  • Login
  • Register
    • Login
    • Home
    • Logout
    • My Account
  • Logout
  • Home
    • My Courses
    • Core Activities
  • Software Training Videos
  • LINK 2 XPS Library
  • Vocabulary of XPS
    • Terms & Phrases for XPS
  • Self-Training
    • AVS Training Courses – 2 days
    • Basics of XPS
    • Chemical States
    • Instrument Details
    • Instrument Operation
    • LINK 2 XPS Library
    • Posters about XPS
    • XPS Guides
    • XPS Theory
  • Blog
  • Cart
  • Checkout
  • Orders
  • Downloads
  • Payment methods
  • Account details
  • Lost password
  • My Account
Previous

2019-07-20_10-35-39

By Vince Crist @ Library|2023-07-10T19:00:10-07:00July 10, 2023|0 Comments

Share This Story, Choose Your Platform!

FacebookXRedditLinkedInWhatsAppTelegramTumblrPinterestVkXingEmail

About the Author: Vince Crist @ Library

B Vincent
XRI Founder

Leave A Comment Cancel reply

Copyright XPS Research Institute 2022 - 2026 |
FacebookXInstagramPinterest
Page load link
Go to Top